Effect of rapid thermal annealing on nanocrystalline TiO 2 thin films synthesized by swift heavy ion irradiation

Applied Surface Science

Volumn 258, Issue 20, 2012, Pages 7855-7859

  Thakurdesai, Madhavi ^a   Kanjilal, D ^b   Bhattacharyya, Varsha ^a  

^a UNIVERSITY OF MUMBAI   (India)

^b INTER UNIVERSITY ACCELERATOR CENTRE   (India)

Author keywords

Electronic excitation; RTA annealing

Indexed keywords

AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; HEAVY IONS; ION BEAMS; ION BOMBARDMENT; NANOCRYSTALS; NANOPARTICLES; OPTICAL PROPERTIES; PHOTOLUMINESCENCE SPECTROSCOPY; RAPID THERMAL ANNEALING; SCANNING ELECTRON MICROSCOPY; THERMODYNAMIC STABILITY; TITANIUM DIOXIDE; ULTRAVIOLET VISIBLE SPECTROSCOPY; X RAY DIFFRACTION;

ELECTRONIC EXCITATION; GLANCING ANGLE X-RAY DIFFRACTIONS; NANOCRYSTALLINE THIN FILMS; OPTICAL CHARACTERIZATION; RAPID THERMAL ANNEALING (RTA); RTA ANNEALING; STRUCTURAL AND OPTICAL PROPERTIES; SWIFT HEAVY ION IRRADIATION;

THIN FILMS;

EID: 84862555649     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2012.04.089     Document Type: Article

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