Preparation of strain-included rutile titanium oxide thin films and influence of the strain upon optical properties

Thin Solid Films

Volumn 515, Issue 5, 2007, Pages 3096-3101

  Nambara, T ^a   Yoshida, K ^a   Miao, L ^b   Tanemura, S ^b   Tanaka, N ^a  

^a NAGOYA UNIVERSITY   (Japan)

^b NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Electon energy loss spectroscopy; Ellipsometry; Optical band gap; Pulse laser deposition; Scanning electron microscopy; Titanium oxide; Transmission electron microscopy

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; ELLIPSOMETRY; ENERGY GAP; LIGHT ABSORPTION; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; SURFACE STRUCTURE; TITANIUM OXIDES; TRANSMISSION ELECTRON MICROSCOPY;

NANO-BEAM DIFFRACTION; OPTICAL BAND GAP; QUANTUM SIZE EFFECT; RUTILE CRYSTALLINE GRAINS;

THIN FILMS;

EID: 33845929018     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.09.004     Document Type: Article

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