Electron emission devices formed by energetic cluster impacts on TiO2 rutile

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 166, Issue , 2000, Pages 788-792

  Thevenard, P ^a   Dupin, J P ^a   Thien Binh, Vu ^a   Purcell, S T ^a   Semet, V ^a   Guillot, D ^a  

^a UNIVERSITÉ LYON 1   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHIZATION; ATOMIC FORCE MICROSCOPY; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON SPECTROSCOPY; FULLERENES; ION BEAMS; ION BOMBARDMENT; PARTICLE BEAM TRACKING; RADIATION EFFECTS; REFRACTORY MATERIALS; SINGLE CRYSTALS;

ELECTRON EMISSION DEVICES; NANOTIPS;

TITANIUM DIOXIDE;

EID: 0033736509     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(00)00002-1     Document Type: Article

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