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Volumn 114, Issue 35, 2010, Pages 14970-14974

Combination of scanning electro n microscopy in the characterization of a nanometer-sized electrode and current fluctuation observed at a nanometer-sized electrode

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT FLUCTUATIONS; EFFECTIVE DIMENSIONS; EFFECTIVE RADIUS; ELECTROCHEMICAL METHODS; ELECTRODE RADII; HIGH-RESOLUTION SCANNING ELECTRON MICROSCOPIES; NERNST-PLANCK EQUATIONS; SCAN RATES;

EID: 79951616189     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp105812r     Document Type: Article
Times cited : (18)

References (34)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.