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Volumn 114, Issue 35, 2010, Pages 14970-14974
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Combination of scanning electro n microscopy in the characterization of a nanometer-sized electrode and current fluctuation observed at a nanometer-sized electrode
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT FLUCTUATIONS;
EFFECTIVE DIMENSIONS;
EFFECTIVE RADIUS;
ELECTROCHEMICAL METHODS;
ELECTRODE RADII;
HIGH-RESOLUTION SCANNING ELECTRON MICROSCOPIES;
NERNST-PLANCK EQUATIONS;
SCAN RATES;
GEOMETRY;
HIGH RESOLUTION ELECTRON MICROSCOPY;
SCANNING ELECTRON MICROSCOPY;
ELECTROCHEMICAL ELECTRODES;
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EID: 79951616189
PISSN: 19327447
EISSN: 19327455
Source Type: Journal
DOI: 10.1021/jp105812r Document Type: Article |
Times cited : (18)
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References (34)
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