Characterization of nanoparticles using atomic force microscopy

Journal of Physics: Conference Series

Volumn 61, Issue 1, 2007, Pages 971-976

  Rao, A ^a   Schoenenberger, M ^a   Gnecco, E ^a   Glatzel, Th ^a   Meyer, E ^a   Brandlin D ^b   Scandella, L ^c  

^a UNIVERSITY OF BASEL   (Switzerland)

^b Nanosurf AG   (Switzerland)

^c NONE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34247476242     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/61/1/192     Document Type: Article

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