Metamaterial near-field sensor for deep-subwavelength thickness measurements and sensitive refractometry in the terahertz frequency range

Applied Physics Letters

Volumn 100, Issue 22, 2012, Pages

  Reinhard, Benjamin ^a   Schmitt, Klemens M ^a   Wollrab, Viktoria ^a,b   Neu, Jens ^a   Beigang, René ^a,b   Rahm, Marco ^a,b  

^a Rheinland Pfälzische Technische Universität Kaiserslautern Landau   (Germany)

^b FRAUNHOFER INSTITUTE FOR PHYSICAL MEASUREMENT TECHNIQUES IPM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FANO RESONANCES; FREQUENCY SHIFT; LIQUID MIXTURE; MATERIAL THICKNESS; MINIMUM THICKNESS; NEAR-FIELD; REFLECTION GEOMETRY; REFRACTIVE INDEX SENSITIVITY; REFRACTIVE INDEX UNITS; REFRACTOMETRY; RESONANCE FREQUENCIES; TERAHERTZ FREQUENCY RANGE; TERAHERTZ SENSORS; THZ RADIATION;

DIELECTRIC MATERIALS; METAMATERIALS; REFRACTIVE INDEX; TERAHERTZ WAVES; THICKNESS GAGES; THICKNESS MEASUREMENT;

SENSORS;

EID: 84862140357     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4722801     Document Type: Article

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