Determining the terahertz optical properties of subwavelength films using semiconductor surface plasmons

Applied Physics Letters

Volumn 93, Issue 24, 2008, Pages

  Isaac, T H ^a   Barnes, W L ^a   Hendry, E ^a  

^a UNIVERSITY OF EXETER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; NUMERICAL ANALYSIS; OPTICAL DATA STORAGE; OPTICAL PROPERTIES; PLASMONS; POLYSTYRENES;

DIELECTRIC LAYERS; FREE SPACES; NUMERICAL CALCULATIONS; SEMI-CONDUCTORS; SEMICONDUCTOR SURFACES; SUB WAVELENGTHS; SURFACE PLASMONS; TERAHERTZ; TERAHERTZ FREQUENCY RANGES; TERAHERTZ LIGHTS; TERAHERTZ SENSING; TIME-DOMAIN MEASUREMENTS;

SEMICONDUCTOR MATERIALS;

EID: 57849129908     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3049350     Document Type: Article

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