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Applied Physics Letters

Volumn 97, Issue 7, 2010, Pages

Highly sensitive terahertz measurement of layer thickness using a two-cylinder waveguide sensor

(3) Theuer, M a,b Beigang, R b,c Grischkowsky, D a

a Oklahoma State University (United States)

b FRAUNHOFER INSTITUTE FOR PHYSICAL MEASUREMENT TECHNIQUES IPM (Germany)

c University of Koblenz Landau (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM WAIST; COATED METALS; HIGHLY SENSITIVE; LAYER THICKNESS; METAL CYLINDERS; SENSITIVITY INCREASE; TERA HERTZ; TERAHERTZ TIME-DOMAIN SPECTROSCOPY; THZ WAVES; WAVEGUIDE SENSORS;

CYLINDERS (SHAPES); SENSORS; TERAHERTZ WAVES; WAVEGUIDES;

TERAHERTZ SPECTROSCOPY;

EID: 77956053546 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3481080 Document Type: Article

Times cited : (38)

References (18)

1
- 0002692107
- OPLEDP 0146-9592. 10.1364/OL.22.000904
- D. Mittleman, S. Hunsche, L. Boivin, and M. Nuss, Opt. Lett. OPLEDP 0146-9592 22, 904 (1997). 10.1364/OL.22.000904
- (1997) Opt. Lett. , vol.22 , pp. 904
- Mittleman, D.¹ Hunsche, S.² Boivin, L.³ Nuss, M.⁴

2
- 27944482979
- APOPAI 0003-6935. 10.1364/AO.44.006849
- T. Yasui, T. Yasuda, K. Sawanaka, and T. Araki, Appl. Opt. APOPAI 0003-6935 44, 6849 (2005). 10.1364/AO.44.006849
- (2005) Appl. Opt. , vol.44 , pp. 6849
- Yasui, T.¹ Yasuda, T.² Sawanaka, K.³ Araki, T.⁴

3
- 0001627554
- APPLAB 0003-6951. 10.1063/1.126587
- Z. Jiang, M. Li, and X. -C. Zhang, Appl. Phys. Lett. APPLAB 0003-6951 76, 3221 (2000). 10.1063/1.126587
- (2000) Appl. Phys. Lett. , vol.76 , pp. 3221
- Jiang, Z.¹ Li, M.² Zhang, X.-C.³

4
- 39049123588
- OPEXFF 1094-4087. 10.1364/OE.16.001786
- J. F. O'Hara, R. Singh, I. Brener, E. Smirnova, J. Han, A. J. Taylor, and W. Zhang, Opt. Express OPEXFF 1094-4087 16, 1786 (2008). 10.1364/OE.16.001786
- (2008) Opt. Express , vol.16 , pp. 1786
- O'Hara, J.F.¹ Singh, R.² Brener, I.³ Smirnova, E.⁴ Han, J.⁵ Taylor, A.J.⁶ Zhang, W.⁷

5
- 58449095873
- APECE4 1882-0778. 10.1143/APEX.2.012301
- S. Yoshida, E. Kato, K. Suizu, Y. Nakagomi, Y. Ogawa, and K. Kawase, Appl. Phys. Express APECE4 1882-0778 2, 012301 (2009). 10.1143/APEX.2.012301
- (2009) Appl. Phys. Express , vol.2 , pp. 012301
- Yoshida, S.¹ Kato, E.² Suizu, K.³ Nakagomi, Y.⁴ Ogawa, Y.⁵ Kawase, K.⁶

6
- 37549036351
- OPEXFF 1094-4087. 10.1364/OE.15.017652
- B. Pradarutti, R. Müller, G. Matthäus, C. Brückner, S. Riehemann, G. Notni, S. Nolte, and A. Tünnermann, Opt. Express OPEXFF 1094-4087 15, 17652 (2007). 10.1364/OE.15.017652
- (2007) Opt. Express , vol.15 , pp. 17652
- Pradarutti, B.¹ Müller, R.² Matthäus, G.³ Brückner, C.⁴ Riehemann, S.⁵ Notni, G.⁶ Nolte, S.⁷ Tünnermann, A.⁸

7
- 84973620367
- JOBPDE 0740-3224. 10.1364/JOSAB.7.002006
- D. Grischkowsky, S. Keiding, M. Exter, and C. Fattinger, J. Opt. Soc. Am. B JOBPDE 0740-3224 7, 2006 (1990). 10.1364/JOSAB.7.002006
- (1990) J. Opt. Soc. Am. B , vol.7 , pp. 2006
- Grischkowsky, D.¹ Keiding, S.² Exter, M.³ Fattinger, C.⁴

8
- 18644377758
- APPLAB 0003-6951. 10.1063/1.1863439
- J. Zhang and D. Grischkowsky, Appl. Phys. Lett. APPLAB 0003-6951 86, 061109 (2005). 10.1063/1.1863439
- (2005) Appl. Phys. Lett. , vol.86 , pp. 061109
- Zhang, J.¹ Grischkowsky, D.²

9
- 75249104782
- OPEXFF 1094-4087. 10.1364/OE.18.001289
- S. -H. Kim, E. S. Lee, Y. B. Ji, and T. -I. Jeon, Opt. Express OPEXFF 1094-4087 18, 1289 (2010). 10.1364/OE.18.001289
- (2010) Opt. Express , vol.18 , pp. 1289
- Kim, S.-H.¹ Lee, E.S.² Ji, Y.B.³ Jeon, T.-I.⁴

10
- 77952079743
- OPEXFF 1094-4087. 10.1364/OE.18.009643
- H. Zhan, R. Mendis, and D. M. Mittleman, Opt. Express OPEXFF 1094-4087 18, 9643 (2010). 10.1364/OE.18.009643
- (2010) Opt. Express , vol.18 , pp. 9643
- Zhan, H.¹ Mendis, R.² Mittleman, D.M.³

11
- 77956024720
- 1829-1171. 1742-6588
- Y. Avetisyan, H. Hakopyan, A. Makaryan, and K. Nerkararyan, Armenian J. Phys. 1829-1171 3, 69 (2010). 1742-6588
- (2010) Armenian J. Phys. , vol.3 , pp. 69
- Avetisyan, Y.¹ Hakopyan, H.² Makaryan, A.³ Nerkararyan, K.⁴

12
- 77952966663
- APPLAB 0003-6951. 10.1063/1.3430740
- M. Theuer, R. Beigang, and D. Grischkowsky, Appl. Phys. Lett. APPLAB 0003-6951 96, 191110 (2010). 10.1063/1.3430740
- (2010) Appl. Phys. Lett. , vol.96 , pp. 191110
- Theuer, M.¹ Beigang, R.² Grischkowsky, D.³

13
- 77952868573
- OPEXFF 1094-4087. 10.1364/OE.18.011456
- M. Theuer, R. Beigang, and D. Grischkowsky, Opt. Express OPEXFF 1094-4087 18, 11456 (2010). 10.1364/OE.18.011456
- (2010) Opt. Express , vol.18 , pp. 11456
- Theuer, M.¹ Beigang, R.² Grischkowsky, D.³

14
- 50449099474
- JOBPDE 0740-3224. 10.1364/JOSAB.25.001059
- W. Withayachumnankul, B. M. Fischer, H. Lin, and D. Abbott, J. Opt. Soc. Am. B JOBPDE 0740-3224 25, 1059 (2008). 10.1364/JOSAB.25.001059
- (2008) J. Opt. Soc. Am. B , vol.25 , pp. 1059
- Withayachumnankul, W.¹ Fischer, B.M.² Lin, H.³ Abbott, D.⁴

15
- 77950861494
- OPCOB8 0030-4018. 10.1016/j.optcom.2010.02.008
- S. R. Tripathi, M. Aoki, K. Mochizuki, I. Hosako, T. Asahi, and N. Hiromoto, Opt. Commun. OPCOB8 0030-4018 283, 2488 (2010). 10.1016/j.optcom.2010. 02.008
- (2010) Opt. Commun. , vol.283 , pp. 2488
- Tripathi, S.R.¹ Aoki, M.² Mochizuki, K.³ Hosako, I.⁴ Asahi, T.⁵ Hiromoto, N.⁶

16
- 0016520214
- APOPAI 0003-6935. 10.1364/AO.14.001335
- D. Smith and E. Loewenstein, Appl. Opt. APOPAI 0003-6935 14, 1335 (1975). 10.1364/AO.14.001335
- (1975) Appl. Opt. , vol.14 , pp. 1335
- Smith, D.¹ Loewenstein, E.²

17
- 0000858481
- OPLEDP 0146-9592. 10.1364/OL.26.000846
- R. Mendis and D. Grischkowsky, Opt. Lett. OPLEDP 0146-9592 26, 846 (2001). 10.1364/OL.26.000846
- (2001) Opt. Lett. , vol.26 , pp. 846
- Mendis, R.¹ Grischkowsky, D.²

18
- 3142695419
- OPLEDP 0146-9592. 10.1364/OL.29.001617
- J. Zhang and D. Grischkowsky, Opt. Lett. OPLEDP 0146-9592 29, 1617 (2004). 10.1364/OL.29.001617
- (2004) Opt. Lett. , vol.29 , pp. 1617
- Zhang, J.¹ Grischkowsky, D.²

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