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Optics Letters

Volumn 37, Issue 9, 2012, Pages 1406-1408

Ultralow-refractive-index optical thin films through nanoscale etching of ordered mesoporous silica films

(6) Chi, Fangting a Yan, Lianghong b Yan, Hongwei b Jiang, Bo a Lv, Haibing b Yuan, Xiaodong b

a SICHUAN UNIVERSITY (China)

b RESEARCH CENTER OF LASER FUSION (China)

Author keywords

[No Author keywords available]

Indexed keywords

FLUOROALKYLSILANES; HIGH MOISTURE; HIGH QUALITY; HIGHLY POROUS SILICA; INTENSIVE RESEARCH; MESOPOROUS SILICA FILM; MICROPTICS; NANO SCALE; OPTICAL QUALITIES; OPTICAL THIN FILMS; ORDERED MESOPOROUS SILICA FILM; SUPERHYDROPHOBIC; THIN FILM MATERIAL; ULTRA-LOW DIELECTRIC CONSTANT; WATER CONTACT ANGLE; WATER-RESISTANCES;

CONTACT ANGLE; DIELECTRIC MATERIALS; MESOPOROUS MATERIALS; MICROELECTRONICS; REFRACTIVE INDEX; SILICA;

THIN FILMS;

EID: 84862075918 PISSN: 01469592 EISSN: 15394794 Source Type: Journal
DOI: 10.1364/OL.37.001406 Document Type: Article

Times cited : (34)

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