Omnidirectional reflector using nanoporous SiO2 as a low-refractive-index material

Optics Letters

Volumn 30, Issue 12, 2005, Pages 1518-1520

  Xi, J Q ^a   Ojha, Manas ^b   Cho, Woojin ^b   Plawsky, J L ^b   Gill, W N ^b   Gessmann, Th ^b   Schubert, E F ^b  

^a Rensselaer Polytechnic Institute   (United States)

^b RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC LAYERS; INTERNAL REFLECTORS; OMNIDIRECTIONAL REFLECTORS; WAVEGUIDE STRUCTURES;

DIELECTRIC AMPLIFIERS; GALLIUM COMPOUNDS; MIRRORS; REFLECTION; REFRACTIVE INDEX; SEMICONDUCTOR MATERIALS; SILVER; WAVEGUIDES;

SILICON COMPOUNDS;

EID: 20944447835     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.30.001518     Document Type: Article

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