Stability and yield-oriented ultra-low-power embedded 6T SRAM cell design optimization

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2012, Pages 93-98

  Makosiej, Adam ^a   Thomas, Olivier ^c   Vladimirescu, Andrei ^a,b   Amara, Amara ^a  

^a Institute Supérieur d'Electronique de Paris   (France)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c CEA GRENOBLE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS;

CELL BEHAVIORS; DESIGN APPROACHES; OPERATING MODES; OPTIMAL DESIGN; STABLE OPERATION; STRICT STABILITIES; SUBTHRESHOLD MODEL; ULTRA LOW POWER;

INTEGRATED CIRCUIT DESIGN;

EID: 84862074877     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/date.2012.6176439     Document Type: Conference Paper

References (9)

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2. Calhoun, B.H. et al., "Static noise margin variation for sub-threshold SRAM in 65-nm CMOS", IEEE Journal of Solid-State Circuits, Volume: 41, 2006
3. J. Wang et al., "Statistical modeling for the minimum standby supply voltage of a full SRAM array," in Proc. Eur. Solid State Circuits Conf., 2007, pp. 400-403.
4. J. Wang et al., "Two Fast Methods for Estimating the Minimum Standby Supply Voltage for Large SRAMs", IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol 29, 12, December 2010
5. J. Wang et al., "Minimum Supply Voltage and Yield Estimation for Large SRAMs Under Parametric Variations", IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2010
6. E. Seevinck et al., "Static-Noise Margin Analysis of MOS SRAM Cells" IEEE Journal of Solid-State Circuits, VOL. SC-22, NO. 5, OCTOBER 1987
7. J-P. Noel, et al., "UT2B-FDSOI Device Architecture Dedicated to Low Power Design Techniques," ESSDERC 2010
8. J. Mazurier, et al., "On the variability in Planar FDSOI technology: from MOSFETs to SRAM cells", IEEE Transactions on Electron Devices 2011
9. A. Makosiej, et al., "An SNM Estimation and Optimization Model forULP sub-45nm CMOS SRAM in the Presence of Variability,"NEWCAS 2010