Data driven identification and aberration correction for model based sensorless adaptive optics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8436, Issue , 2012, Pages

  Antonello, J ^a   Fraanje, R ^a   Song, H ^a,d   Verhaegen, M ^a   Gerritsen, H ^b   Keller, C U ^c   Van Werkhoven, T ^b,c  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UTRECHT UNIVERSITY   (Netherlands)

^c LEIDEN UNIVERSITY   (Netherlands)

^d ZHEJIANG UNIVERSITY   (China)

Author keywords

Aberration correction; Adaptive optics; Multiphoton microscopy; Nonlinear microscopy

Indexed keywords

ABERRATION CORRECTION; CLOSED-FORM EXPRESSION; DATA DRIVEN; DEFORMABLE MIRRORS; IMAGING QUALITY; INTENSITY MEASUREMENTS; LABORATORY ENVIRONMENT; LINEAR SYSTEM OF EQUATIONS; MODEL-BASED OPC; MULTI-PHOTON MICROSCOPY; NONLINEAR MICROSCOPY; OPTIMISATIONS; SENSORLESS; WAVE FRONT SENSORS;

ABERRATIONS; ADAPTIVE OPTICS; FLUORESCENCE MICROSCOPY; LINEAR SYSTEMS; WAVEFRONTS;

OPTIMIZATION;

EID: 84861929346     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.922002     Document Type: Conference Paper

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