Assessing correction accuracy in image-based adaptive optics

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8253, Issue , 2012, Pages

  Débarre, Delphine ^a   Facomprez, Aurélie ^a   Beaurepaire, Emmanuel ^a  

^a PARISTECH   (France)

Author keywords

Aberration correction; Adaptive optics; Multiphoton microscopy; Nonlinear microscopy

Indexed keywords

ABERRATION CORRECTION; CORRECTION ACCURACY; IMAGE QUALITY METRICS; IMAGE-BASED; MINIMUM TIME; MULTI-PHOTON MICROSCOPY; NONLINEAR MICROSCOPY; PARTIAL KNOWLEDGE; SENSORLESS;

ENGINEERING; MOLECULAR PHYSICS;

ADAPTIVE OPTICS;

EID: 84859600621     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.908808     Document Type: Conference Paper

References (12)

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