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Volumn 16, Issue 13, 2008, Pages 9290-9305
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Adaptive optics for structured illumination microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
FLUORESCENCE;
IMAGE QUALITY;
WAVEFRONTS;
ABERRATION CORRECTION;
ABERRATION-CORRECTED;
DIFFERENTIAL ABERRATIONS;
ILLUMINATION PATTERNS;
IMAGE FORMATION PROCESS;
IMAGE QUALITY METRICS;
STRUCTURED ILLUMINATION;
STRUCTURED ILLUMINATION MICROSCOPY;
ADAPTIVE OPTICS;
ARTICLE;
EQUIPMENT;
EQUIPMENT DESIGN;
FLUORESCENCE MICROSCOPY;
ILLUMINATION;
IMAGE ENHANCEMENT;
INSTRUMENTATION;
OPTICS;
THREE DIMENSIONAL IMAGING;
EQUIPMENT DESIGN;
EQUIPMENT FAILURE ANALYSIS;
IMAGE ENHANCEMENT;
IMAGING, THREE-DIMENSIONAL;
LIGHTING;
MICROSCOPY, FLUORESCENCE;
OPTICS;
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EID: 46149083748
PISSN: None
EISSN: 10944087
Source Type: Journal
DOI: 10.1364/OE.16.009290 Document Type: Article |
Times cited : (152)
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References (12)
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