Structural, morphological and optical studies of molarity based ZnO thin films

Journal of Ovonic Research

Volumn 7, Issue 1, 2011, Pages 1-7

  Sakthivelu, A ^a   Saravanan, V ^b   Anusuya, M ^c   Joseph Prince, J ^a  

^a ANNA UNIVERSITY   (India)

^b Mookambigai College of Engineering   (India)

^c Trichy Engineering College   (India)

Author keywords

Optical properties; SILAR technique; Structural and morphological studies; Thin films; XRD; Zinc oxide; ZnO

Indexed keywords

EID: 84861871263     PISSN: 18422403     EISSN: 15849953     Source Type: Journal    
DOI: None     Document Type: Article

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