Memory effects in electrochemically gated metallic point contacts

Applied Physics Letters

Volumn 100, Issue 20, 2012, Pages

  Maul, R ^a   Xie, F Q ^a   Obermair, Ch ^a   Schon G ^a   Schimmel, Th ^a   Wenzel, W ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCALE; DETECTION CAPABILITY; ELECTROCHEMICAL GATING; EXPERIMENTAL OBSERVATION; MEMORY EFFECTS; METALLIC CONTACTS; QUANTUM CONDUCTANCE; RECONSTRUCTION PROCESS; SWITCHING CYCLES; SWITCHING PROCESS;

PHYSICAL PROPERTIES; PHYSICS;

ATOMS;

EID: 84861794418     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4719207     Document Type: Article

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