Comparing the growth of a molecular semiconductor on amorphous and semi-crystalline polycarbonate substrates

Organic Electronics

Volumn 13, Issue 9, 2012, Pages 1594-1601

  Vergnat, Christelle ^a,d   Landais, Virginie ^a,e   Combet, Jérôme ^c   Vorobiev, Alexei ^b   Konovalov, Oleg ^b   Legrand, Jean François ^a   Brinkmann, Martin ^a  

^a UNIVERSITÉ DE STRASBOURG   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c INSTITUT LAUE LANGEVIN   (France)

^d UNIVERSITY OF FREIBURG   (Germany)

^e NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Atomic Force Microscopy; Nanocrystals; Nucleation and growth; Organic semi conductors; Oriented substrates; Phthalocyanines

Indexed keywords

ACTIVATION ANALYSIS; ACTIVATION ENERGY; AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; BIFURCATION (MATHEMATICS); CRYSTALLINE MATERIALS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOCRYSTALS; NUCLEATION; POLYCARBONATES; SEMICONDUCTOR GROWTH; SURFACE STRUCTURE; ULTRAVIOLET VISIBLE SPECTROSCOPY; X RAY DIFFRACTION; ZINC COMPOUNDS;

APPARENT ACTIVATION ENERGY; BISPHENOL A POLYCARBONATES; GRAZING INCIDENCE X-RAY DIFFRACTION; MOLECULAR SEMICONDUCTORS; NUCLEATION AND GROWTH; PHTHALOCYANINES; POLYCARBONATE SUBSTRATES; SOLVENT INDUCED CRYSTALLIZATION;

SUBSTRATES;

EID: 84861792479     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2012.04.031     Document Type: Article

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