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Thin Solid Films

Volumn 520, Issue 16, 2012, Pages 5195-5199

Study of structural and optical properties of Cd 1-xZn xSe thin films

(3) Wahab, L A a Zayed, H A b El Galil, A A Abd a

a NATIONAL CENTER FOR RADIATION RESEARCH AND TECHNOLOGY (Egypt)

b AIN SHAMS UNIVERSITY (Egypt)

Author keywords

Dispersion parameters; Optical properties; Semiconductors; Thermal evaporation; X ray diffraction

Indexed keywords

ABSORPTION COEFFICIENTS; COHESIVE ENERGIES; COMPLEX DIELECTRIC CONSTANT; DIRECT BAND GAP; DISLOCATION DENSITIES; DISPERSION PARAMETERS; DISSIPATION FACTORS; GLASS SUBSTRATES; GRAIN SIZE; LINEAR RELATION; MICRO-STRAIN; OPTICAL DISPERSION; PHOTON ENERGY; STRUCTURAL AND OPTICAL PROPERTIES; THERMAL EVAPORATION TECHNIQUE; WAVELENGTH RANGES; ZN CONTENT;

DISPERSIONS; OPTICAL BAND GAPS; OPTICAL CONDUCTIVITY; OPTICAL CONSTANTS; OPTICAL PROPERTIES; REFRACTIVE INDEX; SEMICONDUCTOR MATERIALS; SUBSTRATES; THERMAL EVAPORATION; THIN FILMS; X RAY DIFFRACTION; ZINC;

SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 84861730458 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2012.03.119 Document Type: Article

Times cited : (53)

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