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Volumn 83, Issue 6, 2009, Pages 891-895
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Brush electrodeposited CdSexTe1-x thin films and their properties
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Author keywords
Electronic material; II VI; Semiconductor; Thin films
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Indexed keywords
CARRIER DENSITIES;
CONDUCTING GLASS;
DIFFERENT SUBSTRATES;
DISLOCATION DENSITIES;
ELECTRONIC MATERIAL;
HEXAGONAL STRUCTURES;
II-VI;
SEMICONDUCTOR;
SUBSTRATE TEMPERATURES;
X-RAY DIFFRACTION STUDIES;
BRUSHES;
CADMIUM ALLOYS;
CADMIUM COMPOUNDS;
CARRIER MOBILITY;
CONDUCTIVE FILMS;
CRYSTALLITE SIZE;
ELECTRIC CONDUCTIVITY;
SEMICONDUCTING CADMIUM COMPOUNDS;
SEMICONDUCTOR MATERIALS;
THIN FILMS;
TITANIUM;
SUBSTRATES;
CRYSTAL STRUCTURE;
DISLOCATION;
SUBSTRATE;
TITANIUM;
X-RAY DIFFRACTION;
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EID: 65549156179
PISSN: 0038092X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.solener.2008.12.014 Document Type: Article |
Times cited : (21)
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References (28)
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