Structural characterization of thermally evaporated CdSe thin films

Chalcogenide Letters

Volumn 5, Issue 8, 2008, Pages 153-163

  Sarmah, K ^a   Sarma, R ^a   Das, H L ^a  

^a GAUHATI UNIVERSITY   (India)

Author keywords

CdSe thin films; Dislocation density; Grain size; Lattice constant; Microstrain

Indexed keywords

EID: 69949148233     PISSN: 15848663     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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