Broadband root-mean-square detector in CMOS for on-chip measurements of millimeter-wave voltages

IEEE Electron Device Letters

Volumn 33, Issue 6, 2012, Pages 752-754

  Lee, Chuan ^a   Choi, Wooyeol ^a   Han, Ruonan ^b   Shichijo, Hisashi ^a   Kenneth, K O ^a  

^a The University of Texas at Dallas   (United States)

^b School of Operations Research and Industrial Engineering   (United States)

Author keywords

Detector; millimeter wave voltage measurement; Schottky diodes

Indexed keywords

CMOS PROCESSS; DETECTOR GAIN; DYNAMIC RANGE; FILTER CAPACITORS; INPUT VOLTAGES; LOW FREQUENCY; ON CHIP MEASUREMENTS; PROCESS MODIFICATIONS; ROOT MEAN SQUARES; SCHOTTKY DIODE DETECTORS; SCHOTTKY DIODES; SELF-TESTING; SIGNAL VOLTAGE;

CMOS INTEGRATED CIRCUITS; MILLIMETER WAVES; SCHOTTKY BARRIER DIODES;

DETECTORS;

EID: 84861701256     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2012.2190258     Document Type: Article

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