An in-vacuum x-ray diffraction microscope for use in the 0.7-2.9 keV range

Review of Scientific Instruments

Volumn 83, Issue 3, 2012, Pages

  Vine, D J ^a,b,c   Williams, G J ^a,d   Clark, J N ^a,e,f   Putkunz, C T ^a,b   Pfeifer, M A ^a,g   Legnini, D ^c   Roehrig, C ^c   Wrobel, E ^c   Huwald, E ^e   Van Riessen, G ^a,e   Abbey, B ^a,b   Beetz, T ^h,i   Irwin, J ^h   Feser, M ^h   Hornberger, B ^h   McNulty, I ^c   Nugent, K A ^a,b   Peele, A G ^a,e,j  

^a Centre of Excellence for Coherent X Ray Science   (Australia)

^b UNIVERSITY OF MELBOURNE   (Australia)

^c ARGONNE NATIONAL LABORATORY   (United States)

^d SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^e LA TROBE UNIVERSITY   (Australia)

^f UNIVERSITY COLLEGE LONDON   (United Kingdom)

^g Department of Obstetrics Gynecology   (United States)

^h XRADIA INC   (United States)

ⁱ STANFORD UNIVERSITY   (United States)

^j AUSTRALIAN SYNCHROTRON   (Australia)

more..

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE FEEDBACK; ADVANCED PHOTON SOURCE; BEAM LINES; COHERENT X-RAY DIFFRACTION; DIFFRACTIVE IMAGING; DYNAMIC RANGE; EXPOSURE TIME; FRESNEL; IN-VACUUM; INTENSITY MEASUREMENTS; LIMIT MOTION; MICROSCOPE DESIGN; PLANE WAVE ILLUMINATION; POINT PROJECTION; SIGNAL TO NOISE; UPPER BOUND;

MICROSCOPES; PROBES; VACUUM;

X RAY DIFFRACTION;

EID: 84861650767     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3688655     Document Type: Review

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