Improvement of the detection system in the soft X-ray absorption spectroscopy

Surface and Interface Analysis

Volumn 44, Issue 6, 2012, Pages 784-788

  Nakanishi, Koji ^a   Ohta, Toshiaki ^a  

^a RITSUMEIKAN UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEPTH-PROFILING ANALYSIS; DETECTION METHODS; DETECTION SYSTEM; FLUORESCENT X RAY; MICROCHANNEL PLATE DETECTOR; PARTIAL ELECTRON YIELDS; PROBE SURFACE; SIGNAL-TO-BACKGROUND RATIO; SILICON DRIFT DETECTOR; SOFT X-RAY ABSORPTION SPECTROSCOPIES; SURFACE SENSITIVITY; TOTAL ELECTRON YIELD;

DETECTORS; FLUORESCENCE;

X RAYS;

EID: 84861597724     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3870     Document Type: Conference Paper

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