XAFS measurements under atmospheric pressure in the soft X-ray region

AIP Conference Proceedings

Volumn 1234, Issue , 2010, Pages 931-934

  Nakanishi, Koji ^a   Yagi, Shinya ^b   Ohta, Toshiaki ^a  

^a RITSUMEIKAN UNIVERSITY   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

Author keywords

soft X ray XAFS; under atmospheric pressure measurement system

Indexed keywords

EID: 77955031984     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3463369     Document Type: Conference Paper

References (6)

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