Simultaneous structure and elastic wave velocity measurement of SiO 2 glass at high pressures and high temperatures in a Paris-Edinburgh cell

Review of Scientific Instruments

Volumn 83, Issue 3, 2012, Pages

  Kono, Yoshio ^a   Park, Changyong ^a   Sakamaki, Tatsuya ^b   Kenny Benson, Curtis ^a   Shen, Guoyin ^a   Wang, Yanbin ^b  

^a CARNEGIE INSTITUTION OF WASHINGTON   (United States)

^b UNIVERSITY OF CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOND DISTANCE; COMPRESSIONAL WAVE VELOCITY; DIRECT LINKS; ELASTIC PROPERTIES; ELASTIC WAVE VELOCITY; ENERGY-DISPERSIVE X-RAY DIFFRACTION; FIRST SHARP DIFFRACTION PEAK; HIGH PRESSURE; HIGH PRESSURE AND HIGH TEMPERATURE CONDITIONS; HIGH TEMPERATURE; INTERMEDIATE RANGE ORDER; MICROSCOPIC STRUCTURES; MULTI-ANGLE; PARIS-EDINBURGH CELL; SHEAR WAVE VELOCITY; SIMULTANEOUS MEASUREMENT; STRONG CORRELATION; STRUCTURE FACTORS;

ACOUSTIC WAVE VELOCITY; ELASTIC WAVES; GLASS; X RAY DIFFRACTION;

VELOCITY MEASUREMENT;

EID: 84861594179     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3698000     Document Type: Review

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