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Journal of Applied Physics

Volumn 91, Issue 10 I, 2002, Pages 7029-7031

Comparison of hard magnetic electrodes for magneto-electronics by magnetic force microscopy

(5) Bruckl H a,b Schmalhonst, J a Boeve, H a Gieres, G a Wecker, J a

a BIELEFELD UNIVERSITY (Germany)

b SIEMENS AG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETS; ARTIFICIAL FERRIMAGNETS; COUNTER ELECTRODES; DEVICE TECHNOLOGIES; DOMAIN PATTERN; EXCHANGE BIASING; EXTERNAL DRIVING; LATERAL SIZES; LOCAL FLUCTUATIONS; LOCAL MAGNETIZATION; LOCAL VARIATIONS; MAGNETIC ELECTRODES; MAGNETIC LAYER STACKS; MAGNETIC LAYERS; MAGNETIC TUNNEL JUNCTION; MAGNETIZATION DIRECTION; MAGNETIZATION RIPPLE; MINOR LOOP; POLYCRYSTALLINE; SENSING ELECTRODE; SENSOR SIGNALS; SMALL AREA; SOFT MAGNETICS; SPIN-VALVE SENSORS; SUBMICRON; SUBMICRON ELEMENTS; SWITCHING BEHAVIORS; SWITCHING FIELD; TUNNELING MAGNETORESISTANCE;

ANTIFERROMAGNETIC MATERIALS; ELECTRODES; MAGNETIC DEVICES; MAGNETIC FORCE MICROSCOPY; MAGNETIC PROPERTIES; MAGNETORESISTANCE; MAGNETOS; SENSORS;

MAGNETIZATION;

EID: 84861516777 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.1447871 Document Type: Article

Times cited : (7)

References (12)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.