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Volumn 206, Issue 19-20, 2012, Pages 3917-3922

Thin TaC layer produced by ion mixing

Author keywords

Defect mediated compound formation; Ion mixing; TaC; TaC coating; Tantalum carbide

Indexed keywords

COATING LAYER; COMPOUND FORMATION; COVER LAYERS; FLUENCES; ION BEAM MIXING; ION ENERGIES; ION FLUENCES; ION MIXING; LAYERED SYSTEMS; REVERSE PROCESS; TAC; TAC COATINGS;

EID: 84861456301     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2012.03.052     Document Type: Article
Times cited : (7)

References (31)
  • 15
    • 0003420793 scopus 로고
    • Eden Prairie, Minnesota, K.D. Childs, B.A. Carlson, L.A. LaVanier, J.F. Moulder, D.F. Paul, W.F. Stickle, D.G. Watson (Eds.)
    • Handbook of Auger Electron Spectroscopy 1995, Eden Prairie, Minnesota. third ed. K.D. Childs, B.A. Carlson, L.A. LaVanier, J.F. Moulder, D.F. Paul, W.F. Stickle, D.G. Watson (Eds.).
    • (1995) Handbook of Auger Electron Spectroscopy
  • 20
    • 84861458333 scopus 로고    scopus 로고
    • SRIM, Stopping and Range of Ions in Matter. Software freely available from The code of SRIM 2011 was used
    • J. F. Ziegler, SRIM, Stopping and Range of Ions in Matter. Software freely available from The code of SRIM 2011 was used, 2011. http://www.srim.org.
    • (2011)
    • Ziegler, J.F.1
  • 24
    • 84861457118 scopus 로고    scopus 로고
    • TRIDYN_FZR, FZR-317, Forschungzentrum Rossendorf, 01314 Dresden, Germany
    • W. Möller and M. Posselt, TRIDYN_FZR, FZR-317, Forschungzentrum Rossendorf, 01314 Dresden, Germany, 2001.
    • (2001)
    • Möller, W.1    Posselt, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.