Electrical resistivity of assembled transparent inorganic oxide nanoparticle thin layers: Influence of silica, insulating impurities, and surfactant layer thickness

ACS Applied Materials and Interfaces

Volumn 4, Issue 5, 2012, Pages 2664-2671

  Bubenhofer, Stephanie B ^a   Schumacher, Christoph M ^a   Koehler, Fabian M ^a   Luechinger, Norman A ^a   Sotiriou, Georgios A ^a   Grass, Robert N ^a   Stark, Wendelin J ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

antimony tin oxide; charge transport; Conductive oxides; core shell nanocrystals; thin films

Indexed keywords

ANTIMONY TIN OXIDE; ANTIMONY-DOPED TIN OXIDE NANOPARTICLES; CONDUCTING LAYERS; CONDUCTIVE LAYER; CONDUCTIVE OXIDES; CORE-SHELL NANOCRYSTALS; CORE/SHELL STRUCTURE; DIP COATING; DOPED OXIDES; ELECTRICAL CONDUCTIVITY; ELECTRICAL RESISTIVITY; ELECTRONIC TRANSPORT; HIGH PURITY; HIGH-TEMPERATURE FLAMES; HIGHLY SENSITIVE; INORGANIC IMPURITIES; INORGANIC OXIDES; INORGANIC SHELL MATERIALS; INSULATING SHELL; LAYER RESISTANCE; LAYER THICKNESS; NANO-PARTICLE DISPERSIONS; ORGANIC ADDITIVES; POLYMER SURFACTANTS; PREPARATION PROCESS; PRESSURE DEPENDENT; SILICA LAYERS; SMALL ORGANIC MOLECULES; SURFACE ADSORBATES; SURFACTANT LAYERS; SURFACTANT-STABILIZED; SYSTEMATIC INVESTIGATIONS; SYSTEMATIC STUDY; THIN LAYERS; TUNNELING EFFECTS; WET-PROCESSING;

ADSORBATES; CHARGE TRANSFER; CONDUCTIVE FILMS; CONSUMER ELECTRONICS; ELECTRIC CONDUCTIVITY; FILM PREPARATION; FLAME SYNTHESIS; INSULATION; MATERIALS TESTING; SHELLS (STRUCTURES); SILICA; SURFACE ACTIVE AGENTS; THIN FILMS; TIN; TIN OXIDES;

DISPERSIONS;

EID: 84861438266     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am300319r     Document Type: Article

References (68)

1. Fortunato, E.; Ginley, D.; Hosono, H.; Paine, D. C. MRS Bull. 2007, 32, 242-247
2. Chopra, K. L.; Major, S.; Pandya, D. K. Thin Solid Films 1983, 102, 1-46
3. Ginley, D. S.; Bright, C. MRS Bull. 2000, 25, 15-18
4. Gordon, R. G. MRS Bull. 2000, 25, 52-57
5. Li, N.; Meng, Q. Synthesis and characterization of antimony-doped tin oxide (ATO) and its application in near infrared shielding glass paint. In Proceedings of the International Conference on Advances in Energy Engineering 2010; Beijing; IEEE: Piscataway, NJ, 2010.
6. Dawar, A.; Joshi, J. J. Mater. Sci. 1984, 19, 1-23
7. Minami, T. Semicond. Sci. Technol. 2005, 20, S35-S44
8. Murdoch, G.; Hinds, S.; Sargent, E.; Tsang, S.; Mordoukhovski, L.; Lu, Z. Appl. Phys. Lett. 2009, 94, 213301
9. Montero, J.; Herrero, J.; Guillén, C. Sol. Energy Mater. Sol. Cells 2010, 94, 612-616
10. Cui, J.; Wang, A.; Edleman, N. L.; Ni, J.; Lee, P.; Armstrong, N. R.; Marks, T. J. Adv. Mater. 2001, 13, 1476-1480
11. Mishra, K.; Johnson, K.; Schmidt, P. Phys. Rev. B 1995, 51, 13972
12. Chin, H. S.; Cheong, K. Y.; Razak, K. A. J. Mater. Sci. 2010, 45, 5993-6008
13. Hou, K.; Puzzo, D.; Helander, M. G.; Lo, S. S.; Bonifacio, L. D.; Wang, W.; Lu, Z. H.; Scholes, G. D.; Ozin, G. A. Adv. Mater. 2009, 21, 2492-2496
14. Look, D. C. Mater. Sci. Eng., B 2001, 80, 383-387
15. Handbook of Photovoltaic Science and Engineering; Luque, A.; Hegedus, S., Eds.; John Wiley & Sons,: Chichester, U.K., 2011.
16. Klein, A.; Koerber, C.; Wachau, A.; Saeuberlich, F.; Gassenbauer, Y.; Schafranek, R.; Harvey, S.; Mason, T. Thin Solid Films 2009, 518, 1197-1203
17. Lee, S. U. K.; Hong, B.; Boo, J. World 2010, 3, 119-123
18. Shanthi, E.; Dutta, V.; Banerjee, A.; Chopra, K. J. Appl. Phys. 1980, 51, 6243-6251
19. Coakley, K. M.; McGehee, M. D. Chem. Mater. 2004, 16, 4533-4542
20. Forrest, S. R. Nature 2004, 428, 911-918
21. Gustafsson, G.; Cao, Y.; Treacy, G. M.; Klavetter, F.; Colaneri, N.; Heeger, A. J. Nature 1992, 357, 477-479
22. Kim, M. G.; Kanatzidis, M. G.; Facchetti, A.; Marks, T. J. Nat. Mater. 2011, 10, 382-388
23. Buhler, G.; Tholmann, D.; Feldmann, C. Adv. Mater. 2007, 19, 2224-2227
24. Lee, S. U.; Boo, J. H.; Hong, B. Jpn. J. Appl. Phys. 2011, 50, 01AB10
25. Goebbert, C.; Nonninger, R.; Aegerter, M. A.; Schmidt, H. Thin Solid Films 1999, 351, 79-84
26. Mueller, V.; Rasp, M.; Rathouský, J.; Schuütz, B.; Niederberger, M.; Fattakhova-Rohlfing, D. Small 2010, 6, 633-637
27. Van Bommel, M.; Groen, W.; Van Hal, H.; Keur, W.; Bernards, T. J. Mater. Sci. 1999, 34, 4803-4809
28. Hoertz, P. G.; Chen, Z.; Kent, C. A.; Meyer, T. J. Inorg. Chem. 2010, 49, 8179-8181
29. Al-Dahoudi, N.; Aegerter, M. A. Thin Solid Films 2006, 502, 193-197
30. Reindl, A.; Mahajeri, M.; Hanft, J.; Peukert, W. Thin Solid Films 2009, 517, 1624-1629
31. Cho, Y. S.; Kim, H. M.; Hong, J. J.; Yi, G. R.; Jang, S. H.; Yang, S. M. Colloids Surf., A 2009, 336, 88-98
32. Mahajeri, M.; Voigt, M.; Klupp Taylor, R.; Reindl, A.; Peukert, W. Thin Solid Films 2010, 518, 3373-3381
33. Koeniger, T.; Muenstedt, H. J. Mater. Sci. 2009, 44, 2736-2742
34. Talapin, D. V.; Lee, J. S.; Kovalenko, M. V.; Shevchenko, E. V. Chem. Rev. 2010, 110, 389-458
35. Maksimenko, I.; Gross, M.; Koeniger, T.; Muenstedt, H.; Wellmann, P. J. Thin Solid Films 2010, 518, 2910-2915
36. Krueger, S.; Hickey, S. G.; Tscharntke, S.; Eychmueller, A. J. Phys. Chem. C 2011, 115, 13047-13055
37. Mueller, K. H.; Herrmann, J.; Raguse, B.; Baxter, G.; Reda, T. Phys. Rev. B 2002, 66, 075417
38. Zamborini, F. P.; Leopold, M. C.; Hicks, J. F.; Kulesza, P. J.; Malik, M. A.; Murray, R. W. J. Am. Chem. Soc. 2002, 124, 8958-8964
39. Kleinjan, W.; Brokken-Zijp, J.; van de Belt, R.; Chen, Z.; de With, G. J. Mater. Res. 2008, 23, 869-880
40. Carotenuto, G.; Valente, M.; Sciume, G.; Valente, T.; Pepe, G.; Ruotolo, A.; Nicolais, L. J. Mater. Sci. 2006, 41, 5587-5592
41. Adams, D. M.; Brus, L.; Chidsey, C. E. D.; Creager, S.; Creutz, C.; Kagan, C. R.; Kamat, P. V.; Lieberman, M.; Lindsay, S.; Marcus, R. A.; Metzger, R. M.; Michel-Beyerle, M. E.; Miller, J. R.; Newton, M. D.; Rolison, D. R.; Sankey, O.; Schanze, K. S.; Yardley, J.; Zhu, X. Y. J. Phys. Chem. B 2003, 107, 6668-6697
42. Zabet-Khosousi, A.; Dhirani, A. A. Chem. Rev. 2008, 108, 4072-4124
43. Stark, W. J.; Strobel, R.; Guenther, D.; Pratsinis, S. E.; Baiker, A. J. Mater. Chem. 2002, 12, 3620-3625
44. Teleki, A.; Suter, M.; Kidambi, P. R.; Ergeneman, O.; Krumeich, F.; Nelson, B. J.; Pratsinis, S. E. Chem. Mater. 2009, 21, 2094-2100
45. Grass, R. N.; Stark, W. J. J. Mater. Chem. 2006, 16, 1825-1830
46. Stark, W. J.; Maedler, L.; Maciejewski, M.; Pratsinis, S. E.; Baiker, A. Chem. Commun. 2003, 588-589
47. Maedler, L.; Kammler, H. K.; Mueller, R.; Pratsinis, S. E. J. Aerosol Sci. 2002, 33, 369-389
48. Teleki, A.; Heine, M. C.; Krumeich, F.; Akhtar, M. K.; Pratsinis, S. E. Langmuir 2008, 24, 12553-12558
49. Borchert, H.; Shevehenko, E. V.; Robert, A.; Mekis, I.; Kornowski, A.; Grubel, G.; Weller, H. Langmuir 2005, 21, 1931-1936
50. Melzak, K. A.; Sherwood, C. S.; Turner, R. F. B.; Haynes, C. A. J. Colloid Interface Sci. 1996, 181, 635-644
51. Fleer, G. J.; Cohen Stuart, M. A.; Scheutjens, J. M. H. M.; Cosgrove, T.; Vincent, B. Polymers at Interfaces; Chapman & Hall: London, 1993.
52. Perry's Chemical Engineers' Handbook, 7 th ed.; Perry, R. H.; Green, D. W., Eds.; The McGraw-Hill Companies: New York, 1997.
53. Athanassiou, E. K.; Grass, R. N.; Stark, W. J. Aerosol Sci. Technol. 2010, 44, 161-172
54. Pratsinis, S. E. Prog. Energy Combust. Sci. 1998, 24, 197-219
55. Stark, W. J.; Pratsinis, S. E. Powder Technol. 2002, 126, 103-108
56. Teleki, A.; Akhtar, M. K.; Pratsinis, S. E. J. Mater. Chem. 2008, 18, 3547-3555
57. Colloid Science: Principles, Methods and Applications, 2 nd ed.; Cosgrove, T., Ed.; John Wiley & Sons: Chichester, U.K., 2010.
58. Zhao, J.; Tan, R.; Zhang, Y.; Yang, Y.; Guo, Y.; Zhang, X.; Wang, W.; Song, W. J. Am. Ceram. Soc. 2011, 94, 725-728
59. Oldfield, G.; Ung, T.; Mulvaney, P. Adv. Mater. 2000, 12, 1519-1522
60. Athanassiou, E. K.; Krumeich, F.; Grass, R. N.; Stark, W. J. Phys. Rev. Lett. 2008, 101, 166804
61. Mamunya, Y. P.; Zois, H.; Apekis, L.; Lebedev, E. V. Powder Technol. 2004, 140, 49-55
62. Sotiriou, G. A.; Sannomiya, T.; Teleki, A.; Krumeich, F.; Voeroes, J.; Pratsinis, S. E. Adv. Funct. Mat 2010, 20, 4250-4257
63. Zhang, X. W.; Pan, Y.; Zheng, Q.; Yi, X. S. J. Polym. Sci., Part B 2000, 38, 2739-2749
64. Schenk, A.; Heiser, G. J. Appl. Phys. 1997, 81, 7900-7908
65. DiStefano, T.; Eastman, D. Solid State Commun. 1971, 9, 2259-2261
66. Guzman, G.; Dahmani, B.; Puetz, J.; Aegerter, M. A. Thin Solid Films 2006, 502, 281-285
67. Goldberg, A. J.; Craig, R. G.; Filisko, F. E. J. Dent. Res. 1978, 57, 563-569
68. Mott, P. H.; Roland, C. M.; Corsaro, R. D. J. Acoust. Soc. Am. 2002, 111, 1782-1790