Characterization of physical properties of thermally evaporated doped CdS thin films for photovoltaics

Key Engineering Materials

Volumn 510-511, Issue 1, 2012, Pages 156-162

  Tariq, G H ^a   Anis Ur Rehman, M ^a  

^a COMSATS Institute of Information Technology ^*  (Pakistan)

Author keywords

Aluminum; CdS; Polycrystalline; Thermal evaporation; Window layer

Indexed keywords

ALUMINUM; ALUMINUM COATINGS; CADMIUM SULFIDE; CADMIUM SULFIDE SOLAR CELLS; CADMIUM TELLURIDE; II-VI SEMICONDUCTORS; OPTICAL PROPERTIES; SEMICONDUCTOR DOPING; SUBSTRATES; SULFUR COMPOUNDS; THERMAL EVAPORATION; THIN FILM SOLAR CELLS; VACUUM EVAPORATION; X RAY DIFFRACTION;

CLEANED GLASS SUBSTRATES; DISLOCATION DENSITIES; POLYCRYSTALLINE; POLYCRYSTALLINE THIN FILM; STRUCTURAL AND OPTICAL PROPERTIES; THERMAL EVAPORATION TECHNIQUE; WINDOW LAYER; X-RAY DIFFRACTION SPECTRUM;

THIN FILMS;

EID: 84861430885     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/KEM.510-511.156     Document Type: Conference Paper

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