The difference between the transverse and in-plane resistivity of vacuum evaporated cadmium sulfide (CdS) thin films

Vacuum

Volumn 79, Issue 1-2, 2005, Pages 14-18

  He, Zhibing ^a   Zhao, Gaoling ^a   Weng, Wenjian ^a   Du, Piyi ^a   Shen, Ge ^a   Han, Gaorong ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

CdS films; In plane resistivity; Transverse resistivity

Indexed keywords

CHEMICAL RESISTANCE; CRYSTAL STRUCTURE; EVAPORATION; STACKING FAULTS; SUBSTRATES; THERMAL EFFECTS; THIN FILMS; VACUUM; X RAY DIFFRACTION;

CDS FILMS; IN-PLANE RESISTIVITY; LATTICE STRUCTURE; TRANSVERSE RESISTIVITY;

CADMIUM SULFIDE;

EID: 20344383721     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2005.01.004     Document Type: Article

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