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Volumn 8, Issue 7, 2012, Pages 2957-2963

Optimize position and path planning of automated optical inspection

Author keywords

Automated optical inspection; Hopfield net; Three layers of MARK point

Indexed keywords

AUTOMATED OPTICAL INSPECTION; HOPFIELD NET; PATH PLANNING PROBLEMS; POINT METHODS; POSITION ACCURACY; THREE-LAYER; TRAVELLING SALESMAN PROBLEM; WORKING TIME;

EID: 84861430593     PISSN: 15539105     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (2)

References (13)
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    • 84861442625 scopus 로고    scopus 로고
    • SMT automatic optical inspection path planning based on ant colony algorithm
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    • (2006) Chinese Journal of Scientific Instrument , vol.27 , Issue.6 , pp. 94-97
    • Bing, L.1    Yun, Z.2
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    • Hopfield, J.J.1    Tank, D.W.2
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    • An incremental clustering based solder joint inspection algorithm for chip component
    • Hongwei Xie, Yongcong Kuang, Gaofei Ouyang et al. An incremental Clustering Based Solder Joint Inspection Algorithm for Chip component. Journal of Computational Information Systems, 7 (14), pages 5193-5200, 2011.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.