200-GHz bandwidth on wafer characterization of CMOS nonlinear transmission line using electro-optic sampling

Microwave and Optical Technology Letters

Volumn 54, Issue 8, 2012, Pages 1858-1862

  Jamshidifar, M ^a   Spickermann, G ^a   Schafer H ^a   Bolivar, P Haring ^a  

^a UNIVERSITY OF SIEGEN   (Germany)

Author keywords

electro optic sampling; nonlinear transmission line; timing jitter

Indexed keywords

DEGRADED SYSTEM; DEVICE PERFORMANCE; ELECTROOPTIC SAMPLING; FAST METHODS; MICROWAVE SOURCES; NONLINEAR TRANSMISSION LINES; ON-WAFER; RELATIVE TIMING; SYSTEM DYNAMIC RANGE; SYSTEM MEASUREMENT;

BANDWIDTH; ELECTRIC LINES; TRANSMISSION LINE THEORY;

TIMING JITTER;

EID: 84861365952     PISSN: 08952477     EISSN: 10982760     Source Type: Journal    
DOI: 10.1002/mop.26954     Document Type: Article

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