Electric field mapping system using an optical-fiber-based electrooptic probe

IEEE Microwave and Wireless Components Letters

Volumn 11, Issue 4, 2001, Pages 164-166

  Yang, K ^b   Katehi, Linda P B ^a,b   Whitaker, J F ^b  

^a IEEE

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Electric field measurement; Electrooptic sampling; Far field radiation patterns; Near field radiation patterns

Indexed keywords

COMPUTER CONTROL SYSTEMS; DIRECTIONAL PATTERNS (ANTENNA); ELECTRIC FIELD MEASUREMENT; GRADIENT INDEX OPTICS; LENSES; MICROWAVE DEVICES; OPTICAL BEAM SPLITTERS; PHOTODIODES; POLARIZATION; PROBES; SEMICONDUCTING GALLIUM ARSENIDE; SINGLE MODE FIBERS;

ELECTRIC FIELD MAPPING SYSTEM; ELECTROOPTIC SAMPLING; FAR-FIELD RADIATION PATTERNS; NEAR-FIELD RADIATION PATTERNS; OPTICAL FIBER BASED ELECTROOPTIC PROBE;

ELECTROOPTICAL DEVICES;

EID: 0035322309     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/7260.916331     Document Type: Letter

References (7)

1. Electrooptic mapping of near field distributions in integrated microwave circuits
2. Electrooptic field mapping of quasioptic power-combining arrays
3. Subpicosecond electrooptic sampling: Principles and applications
4. Novel electromagnetic field probe using electro-flash magneto-optical crystals mounted on optical-fiber facets for microwave circuit diagnostics
5. Electrooptic sampling in GaAs integrated circuits
6. Electrooptic field mapping utilizing external Gallium Arsenide probes