Simultaneous measurements of electric and thermal fields utilizing an electrooptic semiconductor probe

IEEE Transactions on Microwave Theory and Techniques

Volumn 49, Issue 12, 2001, Pages 2523-2531

  Reano, Ronald M ^a,b   Yang, Kyoung ^a,b   Katehi, Linda P B ^a,b   Whitaker, John F ^a,b  

^a IEEE   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Electrooptic effects; Electrothermal effects; Optoelectronic devices; Semiconductor materials

Indexed keywords

ELECTROOPTIC SEMICONDUCTOR PROBES; ELECTROTHERMAL EFFECTS;

BANDWIDTH; COMMUNICATION CHANNELS (INFORMATION THEORY); COMPUTER SIMULATION; ELECTRIC FIELD MEASUREMENT; ELECTRIC IMPEDANCE; ELECTRIC LINES; LIGHT ABSORPTION; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; OPTOELECTRONIC DEVICES; PHOTONS; SEMICONDUCTING GALLIUM ARSENIDE; THERMAL EFFECTS; THERMAL VARIABLES MEASUREMENT;

ELECTROOPTICAL DEVICES;

EID: 0035686876     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.971645     Document Type: Conference Paper

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