Statistically sound evaluation of trace element depth profiles by ion beam analysis

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 281, Issue , 2012, Pages 64-71

  Schmid, K ^a   Von Toussaint, U ^a  

^a MAX PLANCK INSTITUT FÜR PLASMAPHYSIK   (Germany)

Author keywords

Bayesian statistics; Deconvolution; Nuclear reaction analysis

Indexed keywords

BAYESIAN STATISTICS; BEAM DATA; COMPUTATION SPEED; CONFIDENCE INTERVAL; DEPTH PROFILE; EXPERIMENTAL DATA; ION BEAM ANALYSIS; MAXIMUM LIKELIHOOD APPROACHES; NUCLEAR REACTION ANALYSIS; REAL-WORLD APPLICATION; SINGLE SAMPLE; STATISTICAL MODELS; TRACE LEVEL;

DECONVOLUTION; HUMAN COMPUTER INTERACTION;

ION BEAMS;

EID: 84861170062     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2012.03.024     Document Type: Article

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