Direct measurement of the near-field super resolved focused spot in InSb

Optics Express

Volumn 20, Issue 9, 2012, Pages 10426-10437

  Assafrao, A C ^a   Wachters, A J H ^a   Verheijen, M ^a   Nugrowati, A M ^a   Pereira, S F ^a   Urbach, H P ^a   Armand, Marie Francoise ^b   Olivier, Segolene ^b  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b CEA LETI   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CONFOCAL MICROSCOPY; DIFFRACTION; FINITE ELEMENT METHOD; PARTICLES (PARTICULATE MATTER); THREE DIMENSIONAL COMPUTER GRAPHICS;

DIFFRACTION LIMITS; DIRECT MEASUREMENT; EXPERIMENTAL DATA; EXPERIMENTAL EVIDENCE; HIGH RESOLUTION; LASER EXPOSURE; LASER POWER; NEAR FIELD MICROSCOPY; NEAR-FIELD; PUMP-PROBE TECHNIQUE; RIGOROUS SIMULATION; SIMULATION MODEL; SPOT SIZES; SUB-DIFFRACTION; SUB-WAVELENGTH; SUPER-RESOLUTION NEAR-FIELD STRUCTURES; THREE-DIMENSIONAL FINITE ELEMENT METHOD; TIME-RESOLVED; ULTRA-HIGH DENSITY OPTICAL DATA STORAGE;

INDIUM ANTIMONIDES;

ANTIMONY; INDIUM;

ARTICLE; CHEMISTRY; EQUIPMENT; EQUIPMENT DESIGN; LASER; OPTICAL INSTRUMENTATION; RADIATION EXPOSURE;

ANTIMONY; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; INDIUM; LASERS; LENSES;

EID: 84861154278     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.010426     Document Type: Article

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