Bit-error-rate evaluation of super-resolution near-field structure read-only memory discs with semiconductive material InSb

Japanese Journal of Applied Physics

Volumn 49, Issue 8 PART 3, 2010, Pages

  Nakai, Kenya ^a   Ohmaki, Masayuki ^a   Takeshita, Nobuo ^a   Hyot, Bérangère ^a,b   André, Bernard ^a,b   Poupinet, Ludovic ^a,b  

^a MITSUBISHI ELECTRIC CORPORATION   (Japan)

^b CEA GRENOBLE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE LAYER; DISC TILT; EVALUATION SYSTEM; FOCUS OFFSET; INTERFACE LAYER; PARTIAL RESPONSE MAXIMUM LIKELIHOOD; POWER OFFSET; PRACTICAL USE; RANDOM PATTERN; READ STABILITY; READ-ONLY MEMORIES; READONLY; READOUT SIGNALS; ROM DISC; SEMICONDUCTIVE; SUPER RESOLUTION; SUPER-RESOLUTION NEAR-FIELD STRUCTURES; SUPERRENS;

BIT ERROR RATE; INDIUM ANTIMONIDES; MAXIMUM LIKELIHOOD; OPTICAL RESOLVING POWER; PARTICLES (PARTICULATE MATTER);

ROM;

EID: 78049350545     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.49.08KE01     Document Type: Conference Paper

References (9)

1. T. Schlesinger, B. Krogh, and T. Chen: Jpn. J. Appl. Phys. 48 (2009) 03A002.
2. J. Tominga, T. Nakano, and N. Atoda: Appl. Phys. Lett. 73 (1998) 2078.
3. J. Kim, I. Hwang, J. Bae, J. Lee, H. Park, I. Park, T. Kikukawa, N. Fukuzawa, T. Kobayashi, and J. Tominaga: Jpn. J. Appl. Phys. 45 (2006) 1370.
4. B. Hyot, F. Laulagnet, O. Lemonnier, and A. Fargeix: ISOM Tech. Dig., 2007, Mo-B-04.
5. J. Pichon, F. Laulagnet, M.-F. Armand, O. Lemonnier, B. Hyot, and B. André: ISOM/ODS Tech. Dig., 2008, TuP47.
6. R. Kasahara, T. Ogata, T. Kawasaki, H. Miura, and K. Yokoi: Jpn. J. Appl. Phys. 46 (2007) 3878.
7. H. Sugaya, S. Ohkubo, and Y. Yamanaka: Jpn. J. Appl. Phys. 47 (2008) 5856.
8. Y. Kajiwara, S. Higashino, and T. Yamagami: Jpn. J. Appl. Phys. 44 (2005) 3482.
9. B. Hyot, S. Olivier, F. Laulagnet, M. F. Armand, and B. André: ISOM Tech. Dig., 2009, Mo-D-06.