Quantitative characterization of vertically aligned multi-walled carbon nanotube arrays using small angle x-ray scattering

Journal of Nanoscience and Nanotechnology

Volumn 11, Issue 6, 2011, Pages 4995-5000

  Das, Narayan Ch ^a,b   Yang, Kaikun ^a   Liu, Yayong ^a   Sokol, Paul E ^b   Wang, Zhigang ^c   Wang, Howard ^a  

^a State University of New York   (United States)

^b INDIANA UNIVERSITY   (United States)

^c INSTITUTE OF CHEMISTRY   (China)

Author keywords

Alignment; Carbon nanotube arrays; Small angle x ray scattering

Indexed keywords

AZIMUTHAL ANGLE; CARBON NANOTUBE ARRAY; DIFFERENT HEIGHTS; MODEL FITTING; ORDER PARAMETER; QUANTITATIVE CHARACTERIZATION; SAXS SPECTRA; SMALL ANGLE X-RAY SCATTERING; VERTICALLY ALIGNED;

ALIGNMENT; MORPHOLOGY; MULTIWALLED CARBON NANOTUBES (MWCN); X RAY SCATTERING; X RAYS;

SCATTERING;

EID: 84861139271     PISSN: 15334880     EISSN: 15334899     Source Type: Journal    
DOI: 10.1166/jnn.2011.4110     Document Type: Conference Paper

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