Monitoring the layer-by-layer self-assembly of graphene and graphene oxide by spectroscopic ellipsometry

Journal of Nanoscience and Nanotechnology

Volumn 12, Issue 1, 2012, Pages 508-512

  Zhou, Kai Ge ^a   Chang, Meng Jie ^a   Wang, Hang Xing ^a   Xie, Yu Long ^a   Zhang, Hao Li ^a  

^a LANZHOU UNIVERSITY   (China)

Author keywords

Copper phthalocyanine; Graphene; Layer by layer self assembly; Variable angle spectroscopic ellipsometry

Indexed keywords

ASSEMBLY PROCESS; COPPER PHTHALOCYANINE; GRAPHENE OXIDES; HYBRID THIN FILM; LAYER BY LAYER SELF ASSEMBLY; LAYER-BY-LAYER ASSEMBLIES; OPTICAL MODELS; VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY;

HYBRID MATERIALS; REFRACTIVE INDEX; SELF ASSEMBLY; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS;

GRAPHENE;

GRAPHITE; NANOMATERIAL; OXIDE;

ARTICLE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; SPECTROSCOPY; SURFACE PROPERTY; ULTRASTRUCTURE;

CRYSTALLIZATION; GRAPHITE; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOSTRUCTURES; OXIDES; PARTICLE SIZE; SPECTRUM ANALYSIS; SURFACE PROPERTIES;

EID: 84861108293     PISSN: 15334880     EISSN: 15334899     Source Type: Journal    
DOI: 10.1166/jnn.2012.5335     Document Type: Conference Paper

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