Optical detection and characterization of graphene by broadband spectrophotometry

Journal of Applied Physics

Volumn 104, Issue 5, 2008, Pages

  Gray, Alexander ^a,b   Balooch, Mehdi ^b,g   Allegret, Stephane ^c   De Gendt, Stefan ^d,e   Wang, Wei E ^f  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b N and K Technology Inc   (United States)

^c STMICROELECTRONICS   (France)

^d IMEC   (Belgium)

^e UNIVERSITY OF LEUVEN   (Belgium)

^f Intel Corporation Belgium   (Belgium)

^g Etcheverry Hall MCI 730   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEEP-ULTRAVIOLET REGION; DISPERSION RELATIONS; EXTINCTION COEFFICIENT; GRAPHENE; GRAPHENE LAYERS; INDEX OF REFRACTION; MAXIMUM SENSITIVITY; MULTILAYER SUBSTRATES; MULTIPLE INTERNAL REFLECTIONS; OPTICAL DETECTION; OPTICAL SPECTROPHOTOMETRY; OPTICAL-; REFLECTANCE SPECTRUM; SI O2 FILMS; WAVELENGTH RANGES;

CARBON; GRAPHITE; NICKEL; OPTICAL CONSTANTS; OPTICAL MULTILAYERS; OPTICAL PROPERTIES; REFLECTION; REFRACTIVE INDEX; SILICON; SPECTROPHOTOMETRY; TELECOMMUNICATION SYSTEMS; THICKNESS MEASUREMENT;

SUBSTRATES;

EID: 51849128272     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2974096     Document Type: Article

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