Laboratory study of potential induced degradation of silicon photovoltaic modules

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2011, Pages 000821-000826

  Schutze M ^a   Junghanel M ^a   Koentopp, M B ^a   Cwikla, S ^a   Friedrich, S ^a   Muller J W ^a   Wawer, P ^a  

^a Q Cells SE ^*  (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CELL LEVELS; CELL PROCESS; CRYSTALLINE SILICON SOLAR CELLS; CURRENT LOSS; ELECTROLUMINESCENCE IMAGING; I-V MEASUREMENTS; INDUCED DEGRADATION; LABORATORY CONDITIONS; LABORATORY STUDIES; LOCKIN THERMOGRAPHY; LONG TERM PERFORMANCE; PV INSTALLATIONS; SCREEN-PRINTED; SILICON PHOTOVOLTAIC MODULES; SOLAR MODULE; STANDARD SYSTEM; WET CONDITIONS;

BIAS VOLTAGE; DEGRADATION;

PHOTOVOLTAIC EFFECTS;

EID: 84861052563     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2011.6186080     Document Type: Conference Paper

References (13)

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