Test-to-failure of crystalline silicon modules

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2010, Pages 244-250

  Hacke, Peter ^a   Terwilliger, Kent ^a   Glick, Steven ^a   Trudell, David ^a   Bosco, Nick ^a   Johnston, Steve ^a   Kurtz, Sarah ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATED LIFETIME TESTING; ACCELERATED TESTS; ACTIVE LAYER; ANTI REFLECTIVE COATINGS; CRYSTALLINE SILICONS; DAMP HEAT; DARK I-V CURVE; FIELD FAILURE; GRID FINGERS; I - V CURVE; INTERFACE FAILURE; ION DRIFTS; MAXIMUM POWER POINT; METALLIZATIONS; MODULE DESIGN; MOISTURE INGRESS; PHOTOVOLTAIC MODULES; RELATIVE HUMIDITIES; SATURATION CURRENT; SERIES RESISTANCES; SILICON CELLS; SYSTEM BIAS; SYSTEM VOLTAGE; THERMAL IMAGING;

ATMOSPHERIC HUMIDITY; CORROSION; CRYSTALLINE MATERIALS; CURVE FITTING; ELECTROLYSIS; INFRARED IMAGING; PHOTOVOLTAIC EFFECTS; SILICON NITRIDE; THERMAL CYCLING;

BIAS VOLTAGE;

EID: 78650123343     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2010.5614472     Document Type: Conference Paper

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