Potential induced degradation of solar cells and panels

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2010, Pages 2817-2822

  Pingel, S ^a   Frank, O ^a   Winkler, M ^a   Oaryan, S ^a   Geipel, T ^a   Hoehne, H ^a   Berghold, J ^a  

^a Am Studio 16 ^*  (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION MECHANISM; ENERGY GENERATIONS; EXTERNAL POTENTIAL; HIGH-VOLTAGE STRESS; INDUCED DEGRADATION; LIFE-TIMES; LONG TERM STABILITY; P-TYPE SILICON; PV SYSTEM; SOLAR PANELS; SYSTEM LEVELS; TEST SETUPS;

DEGRADATION; PARKS; PHOTOVOLTAIC EFFECTS; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; SOLAR CELLS; SOLAR CONCENTRATORS;

SOLAR ENERGY;

EID: 78650117183     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2010.5616823     Document Type: Conference Paper

References (7)

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2. IEC 61215, "Crystalline Silicon Terrestrial Photovoltaic Modules - Design Qualification and Type Approval" edition 2 (2005).
3. R.G. Ross Jr., G.R. Mon, L.C. Wen and R.S. Sugimura, "Measurement and characterization of voltage- and current-induced degradation of thin-film photovoltaic modules", Solar Cells, Volume 27, Issues 1-4, 1989, Pages 289-298.
4. Swanson et al., "The surface polarization effect in high-efficiency silicon solar cells", 2005.
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6. Kasemann et al., "Spatially resolved silicon solar cell characterization using infrared imaging methods", 2008.
7. M. Wittner, T. Weber, W. Richardson, B. Striner, N. Baggio, "Global test site network paves the way to optimal site-related photovoltaic solution", this conference.