System voltage potential-induced degradation mechanisms in PV modules and methods for test

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2011, Pages 000814-000820

  Hacke, Peter ^a   Terwilliger, Kent ^a   Smith, Ryan ^a   Glick, Stephen ^a   Pankow, Joel ^a   Kempe, Michael ^a   Bennett, Sarah Kurtz Ian ^b   Kloos, Mario ^b  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b TNO   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATION FACTORS; ACTIVE LAYER; CELL SURFACES; COMPETING PROCESS; DAMP HEAT; DEGRADATION MECHANISM; ENCAPSULANTS; HIGH VOLTAGE; HIGH VOLTAGE BIAS; LONG-TERM EFFECTS; MODULE DEGRADATION; NEGATIVE BIAS; OUTDOOR TESTING; POWER-LOSSES; PV MODULES; QUALIFICATION TEST; STRESS LEVELS; SYSTEM VOLTAGE; TESTING METHOD; VOLTAGE BIAS;

BIAS VOLTAGE; CELL MEMBRANES; DEGRADATION; ELECTRIC GROUNDING; PHOTOVOLTAIC EFFECTS; SODIUM;

DURABILITY;

EID: 84861048493     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2011.6186079     Document Type: Conference Paper

References (18)

1. A.R. Hoffman and R.G. Ross, Jr., "Environmental Qualification Testing of Terrestrial Solar Cell Modules," 13th IEEE PVSC, 1978, pp. 835-842.
2. R. Swanson et al., "The Surface Polarization Effect in High-Efficiency Silicon Solar Cells," 15th PVSEC, Shanghai, China (2005).
3. C.R. Osterwald and T.J. McMahon, "History of accelerated and qualification testing of terrestrial photovoltaic modules: A literature review," Prog. Photovolt: Res. Appl. 17 (2009) pp. 11-33.
4. J.H. Wohlgemuth, M. Conway, D.H. Meakin. "Reliability and performance testing of photovoltaic modules," 28th IEEE PVSC, 2000, pp. 1483-1486.
5. N.G. Dhere, "High Voltage Bias Testing of Specially Designed c-Si PV Modules," Proc. of the 2011 PVMRW, www.eere.energy.gov/solar/pv-module- reliability-workshop-2011.html, accessed June 17, 2011.
6. th IEEE PVSC, Honolulu, 2010, pp. 2817-2822.
7. th IEEE PVSC, Honolulu, 2010, pp. 244-250.
8. Markus Beck et al., "Thin Film Module Reliability-Enabling Solar Electric Generation," Proc. of the 2011 PVMRW,www.eere.energy.gov/solar/pv- module-reliability-workshop-2011.html, accessed June 17, 2011, and First Solar, private conversation.
9. J.A. DelCueto and T.J. McMahon, Prog. Photovolt: Res. Appl., 2002; 10, pp.15-25.
10. N.G. Dhere, S.M. Bet, and H.P. Patil, 3rd World Conference on Photovoltaic Energy Conversion (2003) p. 1923.
11. 2:F Transparent Conducting Layers in Thin Film Photovoltaic Modules,"http://www.nrel.gov/pv/thin-film/docs/sno-paper.pdf
12. D.E. Carlson et al., Photovoltaics Res. Appl. 11 [6], (2003) p. 377.
13. th European Photovoltaic Solar Energy Conference and Exhibition/5th World Conference on Photovoltaic Energy Conversion, 6-10 September 2010, Valencia, Spain, pp. 3760-3765.
14. G.R. Mon and R.G. Ross, "Electrochemical Degradation of Amorphous-Silicon Photovoltaic Modules,"Proc. 18th IEEE PVSC, Las Vegas, NV, 1985, pp. 1142-1149.
15. G.R. Mon et al., "Effects of Temperature and Moisture on Module Leakage Current,"18th IEEE PVSC, 1985, pp. 1179-1185.
16. G.R. Mon, "Observations of Solar-Cell Metallization Corrosion," Proc. of the Flat-Plate Solar Array Res. Forum on Photovoltaic Metallization Systems, pp. 137-146, and http://ntrs.nasa.gov
17. Z. Boksay and M. Varga, "Surface Conductivity of Leached Glass," Journal of Non-Crystalline Solids 17 (1975) pp. 349-358.
18. A. Golovoy and M. Zinbo, Polym. Eng. Sci. 29, pp. 1733-1737 (1989).