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Volumn , Issue , 2011, Pages 536-541

A study on cooling efficiency improvement of thin film transistor liquid crystal display (TFT-LCD) modules

Author keywords

BLU; Computational fluid dynamics (CFD); FloEFD; LED; TFT LCD; Thermal simulation

Indexed keywords

ANALYSIS AND MODELING; BLU; COLD CATHODE FLUORESCENT LAMP (CCFLS); COMPUTATIONAL FLUID DYNAMICS SIMULATIONS; COOLING EFFICIENCY; DISPLAY TECHNOLOGIES; FLOEFD; LCD DISPLAYS; LCD MODULE; LONG SERVICE LIFE; MAIN GROUP; TEST DEVICE; TFT-LCDS; THERMAL CAMERA; THERMAL PREDICTION; THERMAL SIMULATIONS; THIN FILM TRANSISTOR LIQUID CRYSTAL DISPLAYS;

EID: 84860908385     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EPTC.2011.6184479     Document Type: Conference Paper
Times cited : (2)

References (8)
  • 2
    • 34547862483 scopus 로고    scopus 로고
    • Light Leakage Improvement of LCD Module by Numerical Analysis
    • ISSN/007-0966X/07/3801-488,491
    • Chen Y.K., Lin M.H., Huang K.F., Light Leakage Improvement of LCD Module by Numerical Analysis, SID 07 DIGEST ISSN/007-0966X/07/3801-488,491, 2007.
    • (2007) SID 07 DIGEST
    • Chen, Y.K.1    Lin, M.H.2    Huang, K.F.3
  • 3
    • 54549107713 scopus 로고    scopus 로고
    • Analysis of LCD Panel Distortionfor Touch Mura Improvement
    • ISSN/008-0966X/08/3903-1541
    • Kim H., Choi H., Ma X., Ryu J., Huangfu L., Lee P., Analysis of LCD Panel Distortionfor Touch Mura Improvement" Proceedings of SID 08 DIGEST ISSN/008-0966X/08/3903-1541,1544, 2008.
    • (2008) Proceedings of SID 08 DIGEST , pp. 1544
    • Kim, H.1    Choi, H.2    Ma, X.3    Ryu, J.4    Huangfu, L.5    Lee, P.6
  • 8
    • 84868365407 scopus 로고    scopus 로고
    • Heat dissipation design and analysis of high power LED array using the finite element method
    • Hui Huang Cheng, De-Shau Huang, Ming-Tzer Lin, "Heat dissipation design and analysis of high power LED array using the finite element method" Proceedings of Microelectronics Reliability xxx (2011) xxx-xxx
    • (2011) Proceedings of Microelectronics Reliability , vol.30
    • Cheng, H.H.1    Huang, D.-S.2    Lin, M.-T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.