Low-temperature-processed IGZO TFTs for flexible AMOLED with integrated gate driver circuits

49th Annual SID Symposium, Seminar, and Exhibition 2011, Display Week 2011

Volumn 1, Issue , 2011, Pages 21-24

  Miura, Kentaro ^a   Ueda, Tomomasa ^a   Nakano, Shintaro ^a   Saito, Nobuyoshi ^a   Hara, Yujiro ^a   Sugi, Keiji ^a   Sakano, Tatsunori ^a   Yamaguchi, Hajime ^a   Amemiya, Isao ^a   Akimoto, Keiko ^a   Kameoka, Hisashi ^a   Tonotani, Junichi ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AM-OLED; ANNEALING CONDITION; BIAS-TEMPERATURE STRESS; GATE DRIVER CIRCUIT; THRESHOLD VOLTAGE SHIFTS;

DISPLAY DEVICES; EXHIBITIONS; FLEXIBLE DISPLAYS; LIGHT EMITTING DIODES;

THIN FILM TRANSISTORS;

EID: 84860713567     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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