White light interferometry for surface profiling with a colour CCD

Optics and Lasers in Engineering

Volumn 50, Issue 8, 2012, Pages 1084-1088

  Kumar, U Paul ^a   Haifeng, Wang ^a   Mohan, N Krishna ^b   Kothiyal, M P ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

Fringe analysis; Phase shifting; Single chip colour CCD camera; Surface profiling; White light interferometry

Indexed keywords

FRINGE ANALYSIS; PHASE-SHIFTING; SINGLE-CHIP; SURFACE PROFILING; WHITE-LIGHT INTERFEROMETRY;

CCD CAMERAS; COLOR; SCANNING; WAVELENGTH;

INTERFEROMETRY;

EID: 84860666579     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optlaseng.2012.02.002     Document Type: Article

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