Quasistatic X-Ray Speckle Metrology of Microscopic Magnetic Return-Point Memory

Physical Review Letters

Volumn 90, Issue 17, 2003, Pages 4-

  Pierce, Michael S ^a   Moore, Rob G ^a   Sorensen, Larry B ^a   Kevan, Stephen D ^b   Hellwig, Olav ^c   Fullerton, Eric E ^c   Kortright, Jeffrey B ^d  

^a UNIVERSITY OF WASHINGTON   (United States)

^b UNIVERSITY OF OREGON   (United States)

^c SAN JOSE RESEARCH CENTER   (United States)

^d LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84860640360     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.90.175502     Document Type: Article

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