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Journal of Physics D: Applied Physics

Volumn 45, Issue 19, 2012, Pages

Electrical and optical properties of point defects in ZnO thin films

(5) Can, Musa M a Ismat Shah, S b Doty, Matthew F b Haughn, Chelsea R b Frat, Tezer c

a SABANCI UNIVERSITY (Turkey)

b UNIVERSITY OF DELAWARE (United States)

c HACETTEPE UNIVERSITY (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; METALLIC FILMS; OPTICAL PROPERTIES; POINT DEFECTS; X RAY DIFFRACTION; ZINC OXIDE;

ANNEALING CONDITION; CONTROLLABLE FORMATION; ELECTRICAL AND OPTICAL PROPERTIES; OXYGEN PARTIAL PRESSURE; SHEET RESISTIVITY; SPECIFIC DEFECTS; ZNO FILMS; ZNO THIN FILM;

THIN FILMS;

EID: 84860344181 PISSN: 00223727 EISSN: 13616463 Source Type: Journal
DOI: 10.1088/0022-3727/45/19/195104 Document Type: Article

Times cited : (78)

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