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Volumn 1, Issue , 2011, Pages 779-782

Approaches to establish PV system reliability

Author keywords

[No Author keywords available]

Indexed keywords

DEVELOPMENT CYCLE; MODELING TECHNIQUE; PV SYSTEM; RELIABILITY ESTIMATION; RISK MITIGATION;

EID: 84860330878     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/IPACK2011-52295     Document Type: Conference Paper
Times cited : (1)

References (13)
  • 2
    • 56249113909 scopus 로고    scopus 로고
    • Terrestrial photovoltaic module accelerated test-to-failure protocol
    • Osterwald, C., "Terrestrial Photovoltaic Module Accelerated Test-to-Failure Protocol", Technical Report NREL/TP-520-42893 (2008); www.nrel.gov/docs/fy08osti/42893.pdf.
    • (2008) Technical Report NREL/TP-520-42893
    • Osterwald, C.1
  • 3
    • 0032083910 scopus 로고    scopus 로고
    • Pitfalls of accelerated testing
    • Meeker, W.Q., "Pitfalls of Accelerated Testing", IEEE Transactions on Reliability, Volume: 47, Issue: 2, pages: 114-118 (1998).
    • (1998) IEEE Transactions on Reliability , vol.47 , Issue.2 , pp. 114-118
    • Meeker, W.Q.1
  • 4
    • 82055176948 scopus 로고    scopus 로고
    • Evaluation of high-temperature exposure of photovoltaic modules
    • DOI: 10.1002/pip.1103
    • Kurtz, S., "Evaluation of high-temperature exposure of photovoltaic modules", Progress in Photovoltaics: Research and Applications, DOI: 10.1002/pip.1103 (2011).
    • (2011) Progress in Photovoltaics: Research and Applications
    • Kurtz, S.1
  • 5
    • 0035401029 scopus 로고    scopus 로고
    • Energy models for fatigue life estimation under uniaxial random loading. Part I: The model elaboration
    • July ISSN 0142-1123, DOI: 10.1016/S0142-1123(01)00016-0
    • Lagoda, T., "Energy models for fatigue life estimation under uniaxial random loading. Part I: The model elaboration", International Journal of Fatigue, Volume 23, Issue 6, July 2001, Pages 467-480, ISSN 0142-1123, DOI: 10.1016/S0142-1123(01)00016-0.
    • (2001) International Journal of Fatigue , vol.23 , Issue.6 , pp. 467-480
    • Lagoda, T.1
  • 9
    • 84885302948 scopus 로고    scopus 로고
    • Semiconductor device reliability failure modes
    • Semiconductor Device Reliability Failure Modes, International SEMATECH.
    • International SEMATECH
  • 11
    • 18844450193 scopus 로고    scopus 로고
    • Estimation of the fatigue life of high strength steel under variable-amplitude tension with torsion: Use of the energy parameter in the critical plane
    • T Łagoda, E. Macha, A. Niesłony, F. Morel, Estimation of the fatigue life of high strength steel under variable-amplitude tension with torsion: Use of the energy parameter in the critical plane, European Structural Integrity Society, 2003, 31, pp.183-202.
    • (2003) European Structural Integrity Society , vol.31 , pp. 183-202
    • Łagoda, T.1    Macha, E.2    Niesłony, A.3    Morel, F.4
  • 12
    • 77950867578 scopus 로고    scopus 로고
    • The energy approach in the calculation of fatigue lives under non-proportional bending with torsion
    • D. Rozumek, Z. Marciniak, C.T. Lachowicz, The energy approach in the calculation of fatigue lives under non-proportional bending with torsion, International Journal of Fatigue, 2010, 32(8), pp. 1343-1350.
    • (2010) International Journal of Fatigue , vol.32 , Issue.8 , pp. 1343-1350
    • Rozumek, D.1    Marciniak, Z.2    Lachowicz, C.T.3
  • 13
    • 17744379816 scopus 로고    scopus 로고
    • Fatigue performance of an injection molded talc-filled polypropylene
    • Y. Zhou, P. K. Mallick, Fatigue performance of an injection molded talc-filled polypropylene, Polymer Engineering and Science, 2005, pp 510-512.
    • (2005) Polymer Engineering and Science , pp. 510-512
    • Zhou, Y.1    Mallick, P.K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.